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1

Information Technology Leadership Challenges — Past, Present, and Future

Journal:

Information Systems Management

Year:

2007

Language:

english

File:

PDF, 123 KB

english, 2007

2

SPIE Proceedings [SPIE Lasers and Applications in Science and Engineering - San Jose, CA (Saturday 22 January 2005)] Photon Processing in Microelectronics and Photonics IV - Laser direct-write of embedded electronic components and circuits

Pique, Alberto, Fieret, Jim, Herman, Peter R., Pratap, Bhanu, Mathews, Scott A., Okada, Tatsuo, Arnold, Craig B., Karns, B. J., Auyeung, Ray C., Bachmann, Friedrich G., Hoving, Willem, Kasser, Moshe,

Year:

2005

Language:

english

File:

PDF, 679 KB

english, 2005

3

Collecting Feedback during Software Engineering Experiments

Amela Karahasanoviæ, Bente Anda, Erik Arisholm, Siw Elisabeth Hove, Magne Jørgensen, Dag I K Sjøberg, Ray Welland

Journal:

Empirical Software Engineering

Year:

2005

Language:

english

File:

PDF, 221 KB

english, 2005

4

SPIE Proceedings [SPIE SPIE OPTO: Integrated Optoelectronic Devices - San Jose, CA (Saturday 24 January 2009)] Photonics Packaging, Integration, and Interconnects IX - Large-scale integrated optics using TriPleX waveguide technology: from UV to IR

Heideman, René, Leinse, Arne, Hoving, Willem, Dekker, Ronald, Geuzebroek, Douwe, Klein, Edwin, Stoffer, Remco, Roeloffzen, Chris, Zhuang, Leimeng, Meijerink, Arjan, Glebov, Alexei L., Chen, Ray T.

Year:

2009

Language:

english

File:

PDF, 1.19 MB

english, 2009

5

Information Technology Leadership Challenges – Past, Present, and Future

Journal:

Year:

2010

Language:

english

File:

PDF, 145 KB

english, 2010

6

SPIE Proceedings [SPIE Microlithography '99 - Santa Clara, CA (Sunday 14 March 1999)] Optical Microlithography XII - Long-term 193-nm laser-induced degradation of fused silica and calcium fluoride

Liberman, Vladimir, Rothschild, Mordechai, Sedlacek, Jan H. C., Uttaro, Ray S., Bates, Allen K., Van Peski, Chris K., Van den Hove, Luc

Year:

1999

Language:

english

File:

PDF, 348 KB

english, 1999

7

SPIE Proceedings [SPIE 23rd Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 22 February 1998)] Optical Microlithography XI - Assessment of optical coatings for 193-nm lithography

Liberman, Vladimir, Rothschild, Mordechai, Sedlacek, Jan H. C., Uttaro, Ray S., Grenville, Andrew, Bates, Allen K., Van Peski, Chris K., Van den Hove, Luc

Year:

1998

Language:

english

File:

PDF, 1024 KB

english, 1998

8

SPIE Proceedings [SPIE 23rd Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 22 February 1998)] Optical Microlithography XI - Damage testing of pellicles for 193-nm lithography

Liberman, Vladimir, Kunz, Roderick R., Rothschild, Mordechai, Sedlacek, Jan H. C., Uttaro, Ray S., Grenville, Andrew, Bates, Allen K., Van Peski, Chris K., Van den Hove, Luc

Year:

1998

Language:

english

File:

PDF, 1023 KB

english, 1998

9

Controls on volcanism at intraplate basaltic volcanic fields

van den Hove, Jackson C., Van Otterloo, Jozua, Betts, Peter G., Ailleres, Laurent, Cas, Ray A.F.

Journal:

Earth and Planetary Science Letters

Year:

2016

Language:

english

File:

PDF, 5.21 MB

english, 2016

10

Spatial analysis of an intra-plate basaltic volcanic field in a compressional tectonic setting: South-eastern Australia

van den Hove, Jackson, Grose, Lachlan, Betts, Peter G., Ailleres, Laurent, Van Otterloo, Jozua, Cas, Ray A.F.

Journal:

Journal of Volcanology and Geothermal Research

Year:

2017

Language:

english

File:

PDF, 2.92 MB

english, 2017

11

IS Research Relevance Revisited: Subtle Accomplishment, Unfulfilled Promise, or Serial Hypocrisy?

Kock, Ned, Gray, Paul, Hoving, Ray, Klein, Heinz, Myers, Michael D., Rockart, Jack

Journal:

Communications of the association for information systems

Year:

2002

File:

PDF, 251 KB

2002